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Products/Services for PROBE TIP
Electric test probes are used to establish a connection between a circuit under test and the measuring instrument. Search by Specification | Learn More about Electrical Test Probes
Ultrasonic horns and ultrasonic boosters are used with ultrasonic transducers and converters. Boosters or velocity transformers amplify ultrasonic vibrations. Ultrasonic horns, sonotrodes, anvils, blades or probes contact and transmit ultrasonic vibration. Learn More about Ultrasonic Horns and Boosters
Thermistor temperature probes sense temperature by using thermistors, devices made of semiconductor materials which exhibit a large change in resistance for a small change in temperature. Search by Specification | Learn More about Thermistor Temperature Probes
Thermocouple temperature probes are bimetallic probes that are used in various temperature-sensing applications. They consist of two wires, each of which is made of a different metallic element or alloy. Search by Specification | Learn More about Thermocouple Temperature Probes
Temperature probes are used in various temperature sensing applications. Technology options include thermocouple, RTD, thermistor and solid state style probes. Search by Specification | Learn More about Temperature Probes
Nondestructive testing (NDT) probes and sensors include eddy current, ultrasonic, induction, hall effect and EMAT and other specialized transducers. Search by Specification | Learn More about Nondestructive Testing (NDT) Probes
RTD temperature probes convert the RTD resistance measurement to a current signal, eliminating the problems inherent in RTD signal transmission via lead resistance. Search by Specification | Learn More about RTD Temperature Probes
Eddy current probes induce detectable eddy currents in ferrous and nonferrous material for flaw detection, weld inspection, and other nondestructive test applications. Search by Specification | Learn More about Eddy Current Probes
Styli and probes are slender, rod-shaped stems and contact tips or points used to probe surfaces in conjunction with profilometers, SPMs, CMMs, gages and dimensional scanners. Learn More about Styli and Probes
Coordinating measuring machine (CMM) probes are transducers that convert physical measurements into electrical signals, using various measuring systems within the probe structure. Search by Specification | Learn More about CMM Probes
...of electrical contact and electrode materials can be application specific or custom. Specific shapes include assembly, bar stock, coated wire, conductive paste or coating, contact tip or button, contact rivet (shanked tip), EDM drilling electrode... Search by Specification | Learn More about Electrical Contact and Electrode Materials
Position probes measure the position of a target surface, usually with a high degree of accuracy. This search form covers many different linear position products. Search by Specification | Learn More about Position Probes
IC pin probes are used to test integrated circuits (ICs). Search by Specification | Learn More about IC Pin Probes
...include probe type, tip and termination style, and electrical output. Products with visual displays and audible alarms are commonly available. Thermocouples are temperature sensors which consist of two wires, each made of a different metal. The wires... Search by Specification | Learn More about Temperature Sensors
Fiber optic probes collect light or spectra from extreme environments inside reaction vessels at high temperatures or pressures. Product types include UV-Vis spectroscopy probes, Raman spectroscopy probes, and refractometry probes. Search by Specification | Learn More about Fiber Optic Probes
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Spring Contact Probes QA Technology Company, Inc.
X Probe Socketless Series QA Technology Company, Inc.
Test Probes QA Technology Company, Inc.
8R Steel Razor, Cutting Edge of Probe Technology QA Technology Company, Inc.
Medical Industry Connectors Multi-Contact USA
Custom Test Probes, Electrical Multi-Contact USA
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Product News for PROBE TIP
X Probe Socketless Series
The X Probe Socketless Series allows a more robust probe to be mounted on closer centers while maintaining a reliable electrical contact from the probe tip to the termination. The conventional method utilizes a probe and socket system. (read more)
Sample Probes
The Sample Probe is hot-tapped into the process through a process isolation valve and sealed off with a Conax Technologies PG gland. The Sample Probe features an angled probe tip. When installed with the long side upstream, the tapered end reduces the particulates entering the Sample Probe by fifty percent to reduce the amount of particulates entering the process analyzer filter. (read more)
FlexAim II - Low Cost Industrial Grade Video Probe
FlexAim II offers industrial grade features at reasonable prices - our 2-way and 4-way probes are constructed with a Tungsten sheath surrounded by a stainless monocoil which is in turn covered with a stainless steel braid and polyimide cover. This rugged design resists both chemical attack and premature mechanical wear. A CMOS camera embedded in the probe tip is isolated by a high qualit... (read more)
6R-S Tip Style added to the Razor Family
QA Technology is pleased to announce the expansion of our Razor family, adding a 90° angled 6R-S tip style. The 6R-S Razor is a viable solution for contacting difficult to probe test pads and vias. This new Razor tip is now available in our .100, .075, .050 center conventional and .075, .050 and .039 center X Probe Socketless products (read more)
Exhaust Gas Thermocouple, Reduced Tip
Conax Technologies has qualified a line of exhaust gas and wheel space thermocouples engineered to provide substantially longer on-line life in gas turbines. A unique reduced tip junction also offers a fast response time of < 1.3 seconds. (read more)
Probes and Accesories
F.W. Bell's fifth generation Gauss/Tesla-Meter probes are designed to meet the electrical and mechanical requirements of virtually any application. Models are available for transverse (lines of flux moving perpendicular through the probe tip) and axial (magnetic lines of flux moving through the length of the probe) measurements. Cryogenic, magnaprobe and multi-axis probes are also available. (read more)
Ball Runner Probe
The contact gauge that allows diameter measurements to better than five microns and surface finish all at the same time. (read more)
ISO-TIP Soldering Irons - SALE Save 10%
Save at least 10% on ISO-TIP Soldering Irons (read more)
Quick Disconnect - Zip-Tip® with TABZ™
Bex molded plastic Zip-Tip® spray nozzles are designed to allow fast and easy installation and removal of spray nozzle tips and adapters, while providing positive alignment of spray pattern. Double VITON® O-Ring seals are supplied standard with each nozzle tip. Now with finger Tabz for easier insertion and removal. (read more)
Tilt / Tip-Over Switches
The tilt and tip-over switches and motion sensors are available as mercury metal and our patented non-mercury metal (patents #5.209.343 and #5.332.876.). Mercury glass tilt switches are also available. All switches are evacuated, filled with inert gas and hermetically sealed to ensure long life and low contact resistance. (read more)
Parts by Number for PROBE TIP
| Part # | Distributor | Manufacturer | Product Category | Description |
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| OS-PROBES-TIP | netCOMPONENTS | Not Provided | Not Provided | Not Provided |
Conduct Research
- How Probe Tip Geometry Affects Contact Reliability
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Common Failure Modes for Test Probes
High electrical resistance between the probe tip and the contact surface is the most common failure mode for probes....(read more)
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TappingMode AFM Imaging in Fluids for the Study of Colloidal Particle Adsorption (AN09)
The ability to image solid surfaces in a liquid medium makes atomic force microscopy (AFM) an attractive tool in the study of liquid-solid interfacial phenomena. One such area of research where AFM...(read more)
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Probing Nano-Scale Forces with the Atomic Force Microscope (AN08)
The ability of the atomic force microscope (AFM) to create three-dimensional micrographs with resolution down to the nanometer and Angstrom scales has made it an essential tool for imaging surfaces in...(read more)
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Using microtechnology to get to nanotechnology
Microtechnology is building the tools researchers need to turn nanoscience into nanotechnology. A U-shaped silicon cantilevered probe is fastened to the tines of a quartz tuning fork. And the...(read more)
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Coating Thickness Measurement: The Fundamentals
Coating thickness measurement is a concern for both finishers and for companies receiving finished components. Defective coatings lead to rust. As a result, product liability requires quality control...(read more)
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Engineer's Assistant Using a PIC16F84A
This compact instrument is intended to be a digital laboratory tool for hardware and, in some cases, software debugging. It contains four instruments in one unit: logic probe, single channel logic...(read more)
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Conductivity Level Switches
Conductivity switches are solid-state devices that detect the presence or absence of electrically conductive liquids. They do so by sending a small current through their probe tip. Current flowing...(read more)
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Tip Evaluation Option for NanoScope Atomic Force Microscopes (AN24)
AFM measurements are limited by the shape of the tip used to probe the sample surface. As the tip wears, the finite size of the AFM tip may not allow the tip to accurately probe narrow or sharp...(read more)
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Tip Characterization and Surface Reconstruction of Complex Structures
Diminishing feature size, combined with requirements for higher throughput during quality control, have steadily increased demand for Critical Dimension Atomic Force Microscopy (CD AFM). In contrast...(read more)
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FLUKE 80PJ-9 Probe, Lance Tip, J See Grainger Industrial Supply Profile & Catalog |
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Temp Probe,Ceramic Tip,Surface,Type J - Temperature Probes -... Temp Probe, Ceramic Tip, Surface, Type J Thermocouple, Mini Probe Connector, Temp Range 32 to 1202 F, Temp Range 0 to 650 C, Wire Length 48 In, Probe See Grainger Industrial Supply Profile & Catalog |
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ASTM E1813 -96(2007) Standard Practice for Measuring and... ASTM E1813 - 96(2007) Standard Practice for Measuring and Reporting Probe Tip Shape in Scanning Probe Microscopy See ASTM International Information |
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The Use of Steel-Tip Homogenizer Probe Results in Sample... The probes we tested were the plastic-tip disposable generator probe 04727-50 and the steel-tip probe 04727-69. |
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Untitled EW-08466-04 Type K PVC-insulated thermocouple probe with epoxy-coated tip; 10'L; 20-gauge |
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Z-Active? Differential Probe Family: P7313 ? P7380A ? P7360A ?... probes uses Tip-Clip? assemblies, an interchangeable probe tip system that enables customers to configure their probe with the optimal tip for their See Tektronix, Inc. Information |
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20X Low Capacitance Probe: P6158 > Data Sheets : Tektronix The compact probe head/tip assembly is compatible with the full line of 3.5 mm probe accessories. See Tektronix, Inc. Information |
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Intra Medical Imaging LLC - Standard and Specialized Surgical... Standard Probe Bent Tip Probe Narrow Tip Probe |
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Multi-tip surface cantilever probe invention Multi-tip surface cantilever probe USPTO Application #: 20070278405 Title: Multi-tip surface cantilever probe |
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Dual tip probe invention Dual tip probe USPTO Application #: 20070164761 Title: Dual tip probe |
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